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Don’t forget to vote in the MAS Election!
/in News Item /by webbymasMAS Election season is here! The election will run until December 1st. Two people are running for the position of MAS Director, and one person for the position of MAS Secretary.
In Memory of our Microanalysis Colleague Daniel Kent Ross
/in News Item /by avdhandtWe are saddened to hear of the passing of our colleague Daniel Kent Ross.
MAS Events at M&M2021
/in M&M Meeting /by webbymasCast your vote for the Microscopy Today 2021 Micrograph Awards!
/in Awards, M&M Meeting /by avdhandtVoting is now open for the Microscopy Today 2021 Micrograph Awards! Cast your vote for the People’s Choice Award.
One more day to get the Early Bird registration rate for M&M 2021!
/in M&M Meeting, News Item /by avdhandtDon’t miss out on the discounted registration fee for M&M2021!
The Early Bird registration rate deadline was extended to June 15, 2021. Register by this Tuesday and save money at all registration levels.
Register here for M&M 2021!
Congratulations to the 2021 Major Award Winners!
/in Awards, News Item /by webbymasThe Major Awards of the Society honor distinguished scientific contributions to the field of microscopy and microanalysis by technologists and by scientists at various career stages, as well as distinguished service to the Society. The honor will be conferred at the upcoming Microscopy & Microanalysis 2021 (M&M 2021) meeting.
Please congratulate this year’s awards winners!
PRESIDENTIAL SCIENCE AWARD
Hideyuki Takahashi
JEOL Ltd
PRESIDENTIAL SERVICE AWARD
John Fournelle
University of Wisconsin, Madison
PETER DUNCUMB AWARD FOR EXCELLENCE IN MICROANALYSIS
Yimei Zhu
Brookhaven National Laboratory
KURT F.J. HEINRICH AWARD
Katherine Burgess
U.S. Naval Research Laboratory
ZEISS SCOPEs Grant: Apply to win a free microscope for your K-12 classroom
/in News Item /by avdhandtAnyone interested can find out more information and apply here: ZEISS SCOPEs Grant
Virtual EPMA Workshop from Athens
/in News Item /by Nicholas RitchieInterested individuals should consult the meeting website.
The votes are in: 2021 MAS Leadership Election Results
/in Leadership, News Item /by avdhandtThe M&M 2021 Submission Site is now open!
/in M&M Meeting, News Item /by avdhandtUpcoming: ASTM E42 Surface Analysis Community Forum on 11/06/2020
/in News Item /by avdhandtASTM committee E42 on surface analysis invites you to attend our community forum discussion on issues affecting credibility in XPS analysis and interpretation.
ASTM E42 Surface Analysis Community Forum
Friday, November 6, 2020,
12:00 EST (18:00 Europe, 17:00 UK, 09:00 Pacific US)
Duration: 90 minutes
ASTM WebEx Meeting Registration Link
https://astm.webex.com/astm/j.php?RGID=r9eef58a8e94646b8d9cb098bb0a671f5
Registration required to receive meeting login.
Data in the literature that is poorly acquired, analyzed, or presented can have far reaching effects on the credibility of any technique. Ensuring that the community has the resources available to help the expanding user base will benefit us all
Join us for a virtual discussion of this surface analysis research community topic and help determine the best solution path that addresses these pressing issues.
Leading experts will lead discussion with participants, laying out the specifics of the problem, explaining how this has progressed and the resources currently available, and then looking forward to how we can improve the resources available and their distribution, with a goal of providing tools to improve research results.
The Problem, as it affects the research community
Matt Linford will describe a multi-institutional and multi-country analysis of XPS reported in three scientific journals which demonstrates significant problems in the analysis of XPS data appearing in the literature. He will describe a quantitative assessment of the problems and report information learned about the most common issues that have been observed.
The Structure of the current toolkit
Mark Engelhard will then provide a short summary of early issues in XPS analysis which motivated the creation of the standards committees ASTM E42 and ISO TC201, and will summarize the types of standards and guides that have been created, and explain some of the inter-relationships among relevant surface analysis standards in E42 and TC201. Recent investigations questioning the adequacy of the reporting of analysis information specified in ISO and ASTM standards will be discussed, as an example of the limitations of the standards and guides in meeting the community data reporting challenges.
The Strategy Going Forward
Don Baer will relay the development of recent guides that are intended to help address the issues and explain what is still in the pipeline. He will explore other tools that might be useful, including the possibility of an XPS reporting guide that could indicate prescribed reporting for levels of confidence and the work towards normalization of these. One objective of this presentation is to seek community input on tools and/or other approaches on how to decrease the incorrect XPS data reports in the literature. Such discussion can guide development of ASTM 42, ISO TC201, AVS Recommended Practices and other activities.
Together, we can build a framework to ensure that resource is available for the research community to help improve the quality of surface analysis result reporting!
MAS webinar: “TKD 101: An Introduction to Transmission Kikuchi Diffraction”
/in MAS webinars, News Item /by avdhandtPlease join us for another MAS webinar! Chad Parish, Research and Development Staff Member in the Radiation Effects and Microstructural Analysis Group, Oak Ridge National Laboratory and long-time MAS member will talk about about the basics of Transmission Kikuchi Diffraction, analytical strategies and error sources and show a few examples of practical materials problem solving using TKD.
The live webinar will consist of a 50-minute presentation, followed by a Q&A. The webinar is free but requires a registration.
When: November 20, 2020 at 1 p.m. EDT.
Registration: https://umn.zoom.us/webinar/register/WN__vfPG3FBQAOzcYuIVfso2g
Webinar description: Over the last two to three decades, electron backscatter diffraction (EBSD) emerged as one of the most powerful and exciting methods in electron microscopy to quantify the crystallographic microstructures of materials. Over the last decade or so, transmission Kikuchi diffraction (TKD) has emerged as a vital and important complement to EBSD.
In TKD, a thin specimen (as might be used for transmission electron microscopy) is mounted into the scanning electron microscope (SEM) and held very near (<10 mm) the objective lens. Electron Kikuchi diffraction patterns are then acquired using the EBSD hardware, but in transmission mode and from the electron exit surface of the foil, as opposed to reflection mode from the entrance surface as in EBSD. This provides improved spatial resolution, often 10 nm or finer, compared to several hundred nm or coarser in conventional EBSD. This opens unprecedented capabilities for materials analysis.
This seminar will (1) briefly discuss the basics of TKD and put them into their historical perspective compared to EBSD; (2) discuss how to acquire TKD data, with emphasis on artifacts, errors, and things to watch out for; and (3) show a few examples of practical materials problem solving using TKD.
This work is supported by US Department of Energy, Office of Science, Fusion Energy Sciences, under contract number DE-AC05-00OR22725.
Keywords: SEM, TKD, EBSD
Webinar Speaker: Dr. Chad Parish is a Research and Development Staff Member in the Radiation Effects and Microstructural Analysis Group, Materials Science and Technology Division, Oak Ridge National Laboratory. His research involves electron microscopy to solve problems in materials for nuclear energy systems. Chad has been an MAS member since 2004 and the Secretary of MAS since 2018.
New President’s Address
/in Leadership /by avdhandtRead here the letter from our new MAS president Heather Lowers!
MAS webinar: “Correcting the Scientific Record: RNA Mediation of Pd Metal-Metal Bonds”
/in MAS webinars, News Item /by avdhandtPlease join us for another MAS webinar on September 22 2020 at 2 p.m. (EDT)! Leonard Donovan, Oak Ridge National Laboratory will talk about RNA Mediation of Pd Metal-Metal Bonds and his role in correcting the scientific record. The live webinar will consist of a 50-minute presentation, followed by a Q&A.
Solicitation of Nominations for MAS Fellow and New Nomination Deadline
/in MAS Fellows, News Item /by avdhandt***New Deadline for MAS Fellows Nominations***
Dear MAS Members,
The Microanalysis Society is soliciting nominations for the 2021 Class of MAS Fellows. This 2021 Class should represent outstanding MAS members who have made sustained contributions to the field and the Society. Fellows serve as ambassadors of the Society to the community and the greater public. They should inspire younger individuals to reach for greater achievements. The Awards will be presented at M&M 2021.
Please consider any nominations you wish to make and submit a 2021 Fellow nomination package. The deadline for 2021 nominations is September 30, 2020. You may find directions for the nomination at https://the-mas.org/awards/mas-fellows/.
Our long-term target is that no more than 10% of MAS membership will be designated “Fellow” at any given time. With the first three Classes of Fellows, we achieved this goal. Hereafter, we expect to elect about 0.5% of the membership (about two) each year.
Thank you in advance in behalf of the Fellows Committee of MAS.
Tom Kelly
Chair, MAS Fellows Committee