MAS Topical Conferences

MAS Topical Conferences

An MAS Topical Conference (TC) typically consists of 3-day plenary sessions dedicated to a topic of interest to the microanalysis and microscopy community. MAS TCs provide an excellent environment for scientific and technical discussion among students, researchers, and the vendor communities. Recent TCs have included tutorials and laboratory demonstrations of analytical instrumentation coupled with excellent technical programs.  Education and student financial support are priorities of the TC program.

QMA-2019

Would you like to organize your own MAS Topical Conference?

An MAS TC overview can be found by clicking on the link. The overview includes a web-based TC Proposal Form that gives prospective TC organizers a sense of what’s involved.

Upcoming MAS TCs

Due to the ongoing spread of COVID-19 (coronavirus), the organizing committee and Microanalysis Society have decided to postpone the EBSD 2020 topical conference until 2021. New dates will be advertised as soon as they have been confirmed. All those who had previously registered for EBSD 2020 will receive a full refund of their registration fee. Details regarding refunds have been provided to all registrants via email. If you have any questions, please contact us at ebsd2020@gmail.com.

EBSD 2021 will be held at the University of Michigan, the site of the extremely successful EBSD 2018 meeting.  EBSD 2021 will start with a day of tutorials and hands-on demonstrations followed by 2 days of technical presentations and discussions and vendor demonstrations.  EBSD 2021 will be an opportunity for all practitioners of EBSD—from newcomers to seasoned professionals—to learn about the latest technical advances and share their experiences.

Please follow this link for the original conference information and details and any future updates.

History of MAS TC Program

For many years, the Microanalysis Society has sponsored a series of topical conferences on subjects of interest to its membership. Beginning in 2002, MAS partnered with the National Institute of Standards and Technology (NIST) to host the first several topical conferences. Beginning in 2008, MAS has worked with a variety of other partner institutions in the hosting of conferences dedicated to particle analysis, electron backscatter diffraction, cathodoluminescence, standards and microprobe analysis. A full listing of past MAS Topical Conferences can be found below:

Quantitative MicroAnalysis 2019 (QMA 2019) 
June 24-27th, 2019, University of Minnesota, Minneapolis, MN

Organizing Committee:
Heather Lowers, US Geological Survey
Julien Allaz – ETH Zurich
Emma Bullock – Carnegie Institute of Washington
Paul Carpenter – Washington University of St. Louis
Julie Chouinard – University of Oregon
John Fournelle – University of Wisconsin, Madison
Abigail Lindstrom – National Institute of Standards and Technology
Owen Neill – University of Michigan
Nicholas Ritchie – National Institute of Standards and Technology
Anette von der Handt – University of Minnesota

QMA-2019

Electron Backscatter Diffraction 2018 (EBSD 2018)
May 24-26th, 2016, University of Alabama, Tuscaloosa, AL

Organizing Committee:
Steve Niezgoda – Ohio State University
Marc DeGraef – Carnegie Mellon University
Elena Miranda – California State University – Northridge
Andrew Cross – Washington University – St Louis
Bobby Kerns – University of Michigan
John Mansfield – University of Michigan
Joseph Michael – Sandia National Laboratories

EPMA 2016
May 17-19th, 2016, University of Wisconsin, Madison, WI

Organizing Committee: Paul Carpenter, John Armstrong, John Fournelle, Raynald Gauvin, Dan Kremser, Heather Lowers, Julien Allaz, Kat Crispin, Nicholas Ritchie, and Anette von der Handt

Electron Backscatter Diffraction 2016 (EBSD 2016)
May 24-26th, 2016, University of Alabama, Tuscaloosa, AL

Organizing Committee: Luke Brewer – University of Alabama
Elena Miranda – California State University – Northridge
Whitney Behr –  University of Texas
Yoosuf Picard –  Carnegie Mellon University
Rich Martens –  University of Alabama
Joseph Michael – Sandia National Laboratories

IUMAS-6 (held in conjunction with Microscopy and Microanalysis 2015)
August 2 – 7th, 2015, Hartford, CT

Chair: Edward P. Vicenzi – Smithsonian Institution
Vice-Chair: Paul K. Carpenter – Washington University of St. Louis

IUMAS-6 logo

Electron Backscatter Diffraction 2014 (EBSD 2014)
June 17-19th, 2014, Carnegie Mellon University, Pittsburgh, PA

Chair: David Fullwood – Brigham Young University
Co-Chair: Elena Miranda – California State University – Northridge
Co-Chair: Desmond Moser – The University of Western Ontario
Co-Chair: Yoosuf Picard – Carnegie Mellon University

Electron Backscatter Diffraction 2012 (EBSD 2012)
June 19-21st, 2012, Carnegie Mellon University, Pittsburgh, PA

Organizing Committee Chair: Andrew Deal – General Electric

Microanalytical Reference Materials (Standards 2012)
May 15-17th, 2012, Golden, CO

Organizing Committee Chair: Heather A. Lowers – U.S. Geological Survey

Organizing Committee: Heather Lowers, Alan Koenig, Brian Gorman, Steve Wilson, David Adams, Greg Meeker

Cathodoluminescence (CL 2011), co-organized by AMAS
October 24-28th, 2011, Gaithersburg, MD

Organizing Committee Chair: Colin MacRae – CSIRO Minerals

Electron Backscatter Diffraction 2010 (EBSD 2010)
May 24-26th, 2010, Madison, WI

Organizing Committee Chair: Luke N. Brewer – Sandia National Laboratories

Microanalysis of Particles (Particles 2009)
April 20-23rd, 2009, Westmont, IL

Organizing Committee Chair: Craig Schwandt – McCrone Associates, Inc.

Electron Backscattered Diffraction (EBSD 2008)
May 20-22nd, 2008, University of Wisconsin, Madison, WI

Organizing Co-Chairs: Luke Brewer and Joseph Michael – Sandia National Laboratories
Local Host Chair: John Fournelle – University of Wisconsin, Madison

Hyperspectral Imaging II (HI-II)
October 23-26th, 2007, Gaithersburg, MD

Organizing Committee Chair: Ed Vicenzi – Smithsonian Institution

Particle Workshop 2006
April 24-26th, 2006, Gaithersburg, MD

Chair: Nicholas Ritchie – National Institute of Standards and Technology

Variable Pressure and Environmental SEM for Imaging and Microanalysis
November 2-4, 2005, Gaithersburg, MD

Chairs: Dale Newbury and Scott Wight – National Institute of Standards and Technology

Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology
November 8-10, 2004, Gaithersburg, MD

Chairs: Dale Newbury and Cedric Powell – National Institute of Standards and Technology

Spectrum Imaging and Multispectral / Hyperspectral Data Analysis
April 28th – May 1st, 2003, Gaithersburg, MD

Organizing Committee Chair: John Henry Scott – National Institute of Standards and Technology

Understanding the Accuracy Barrier of Quantitative Electron Beam X-ray Microanalysis and the Role of Standards
April 8-11, 2002, Gaithersburg, MD

Chairs: Dale Newbury and Ryna Marinenko – National Institute of Standards and Technology