The Executive Council consists of the elected representatives of the membership. Through 2013, the Executive Council will be “composed of six Directors and the following officers, the President, President-Elect, the Past-President, the Secretary, and the Treasurer,” consistent with the 2007 revision of the MAS Bylaws, as indicated in Article XI, Section 2.
Nanoscale Materials Section
Materials Science and Technology Division
Naval Research Laboratory
4555 Overlook Ave SW
Washington, DC 20375
Rhonda joined MAS in 2005. She has served MAS in multiple roles, as a Tour Speaker (2006,2017-), as a Director (2012-2014), as chair of the Strategic Planning Committee (2014-2017), and as President-Elect (2017-2018). She holds degrees in physics from Cornell (A.B. ’91) and Washington University in St. Louis (Ph.D. ’96). Her research expertise is in the coordinated analysis of synthetic and natural nanoscale materials, using electron, ion, and X-ray beam methods. As head of Nanoscale Materials Section at the Naval Research Laboratory in Washington, DC, she maintains the DoD’s most advanced electron microscopy facility for basic research, including a Nion UltraSTEM 200-X and a JEOL 2200FS. Ongoing projects in her group include investigation of the cosmic recycling of dust from ancient stars into new solar systems and the development of functionalized nanomaterials for sensor and renewable energy applications. She is a fellow of the American Physical Society and of the Meteoritical Society. Asteroid 8468Rhondastroud was named by the IAU in her honor for her contributions to the understanding of planetary materials.
U.S. Geological Survey
Box 25046 Denver Federal Center
Mail Stop 973
Denver, CO 80225-0046
Tel: +1 303 236 1184
Department of Materials Science and Engineering
Bethlehem, PA 18015
Tel: (610) 758-4207
Masashi is an Associate Professor at the Department of Materials Science and Engineering and an Associate Director of the Electron Microscopy & Nanofabrication Facility in Lehigh University. Masashi’s research emphasizes materials characterization using various electron microscopy approaches involving analysis via X-rays and energy-loss electrons in analytical electron microscopes (AEMs) and atomic-resolution high angle annular dark-field (HAADF) imaging in scanning transmission electron microscopes (STEMs). He developed the ζ (zeta)-factor method for quantitative X-ray analysis and implemented multivariate statistical analysis (MSA) for spectrum images of X-rays and energy-loss electrons. He has published over 150 articles and his MSA plug-in package for Gatan DigitalMicrograph is now commercialized from HREM Research Inc. since 2009. He received the K.F.J. Heinrich young scientist award from the Microbeam Analysis Society in 2005, the Kazato Prize from the Kazato Research Foundation in 2008 and the Seto Award (the Society Award) from the Japanese Society of Microscopy in 2011. He has been a lecturer/organizer in the STEM course at the Lehigh Microscopy School since 2001 and a lecturer in the Arizona State University Winter School on High-Resolution Electron Microscopy since 2008.
Oak Ridge National Laboratory
Materials Science and Technology Division
Oak Ridge, TN, USA, 37831
Tel: (865) 574 0092
Chad Parish holds a Ph.D. in Materials Science and Engineering from North Carolina State University (2006), and previously was a post-doctoral scholar at Sandia National Laboratories (2007-2009). He is now a Research and Development Staff Member at Oak Ridge National Laboratory (2009-present). His research interests include the use of analytical TEM, STEM, and SEM to solve problems in nuclear materials and materials for extreme environments.
1604 W. Canterbury Court
Arlington Heights, IL 60004-2304
Elaine Schumacher now works as an independent consultant in electron microscopy, following a 36-year career in the industry. She spent 15 years as a Senior Research Scientist at McCrone Associates. In her role as an analytical consultant there, she used AEM and SEM to characterize a wide variety of materials, with an emphasis on small particle analysis. She served as an expert witness in civil cases involving materials identification and taught a TEM short course for the Hooke College of Applied Sciences. Elaine also worked for 21 years at UOP, where her microscopy experience included the use of dedicated STEM, TEM, and VP-SEM to study zeolites and supported metal catalysts for petroleum refining processes. While working as a research scientist at UOP, Elaine was named as a co-inventor on several patents. Elaine served for 10 years in various offices on the Executive Council of the Midwest Microscopy and Microanalysis Society and was a Director on the MAS Executive Council prior to being elected to her current post as MAS Treasurer.
University of Oregon
Center for Advanced Materials Characterization
MicroAnalytical Facility Manager
1443 E. 13th Avenue Eugene, OR 97403
Tel: (541) 346-4580
Julie Chouinard is the lab manager for the MicroAnalytical and Surface Analytical laboratories in the Center for Advanced Materials Characterization in Oregon (CAMCOR) at the University of Oregon (UO). As part of a multiuser facility she analyzes a wide variety of materials using multiple different techniques, including electron microprobe analysis (EPMA), scanning electron microscopy (SEM), x-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning near-field optical microscopy (SNOM) with Raman, and ellipsometry. Julie examines samples from academic and industrial clients, as well as training and aiding researchers on instrument operation and data analysis. Since 2015, she has taught a graduate level course on EPMA and assisted teaching a course on surface analysis techniques. She is also involved in running the Advanced Materials Analysis and Characterization (AMAC) master’s degree program at UO, an interdisciplinary program that trains students on innovative instrumentation and careers in industry. Julie has been a member of the Microanalysis Society (MAS) since 2012 and a director since 2016; she has presented original research at several of the annual Microscopy and Microanalysis conferences and most recently organized a symposium celebrating the 50th anniversary of MAS.
Vincent S. (Vin) Smentkowski
General Electric –Global Research Center
1 Research Circle
Building K1 1D41
Niskayuna, NY 12309
Vin is a Senior Scientist in the Functional Materials Organization at General Electric Global Research (GEGR) where he performs surface analysis to support research programs at GEGR, GE businesses, and strategic partners. Vin obtained a B.S. degree in chemistry from Marshall University in 1987 and a Ph.D. in physical chemistry (1994) from the University of Pittsburgh, under the guidance of Prof. John T. Yates, Jr. After completing his degree, Vin accepted a post-doctoral position at Argonne National Laboratory where he was part of a multi-laboratory team that designed, built, and tested a novel reflectron analyzer for real-time, in-situ, studies of surfaces during film growth at mTorr pressures using pulsed ion beam techniques – the work resulted in a 1997 R&D 100 Award. Currently. Vin’s research is focused on the applications of ToF-SIMS analysis, emphasizing how multivariate statistical analysis tools facilitate data reduction. Vin is also working with external laboratories in order to evaluate advanced microstructural characterization techniques such as Atom Probe Tomography and Helium Ion Microscopy and show the benefits these techniques have for industrial materials. Vin holds 6 U.S. patents, more than 90 publications in refereed journals, more than 140 GEGR internal manuscripts, numerous contributed and invited talks. Vin has co-authored 3 book chapters and edited one book “Surface Analysis and Techniques in Biology” (Springer, 2014). He serves as a mentor to many researchers. Vin was named a Fellow of the American Vacuum Society (AVS) in 2010. Vin served as the MAS co-chair for the 2012 and 2013 Microscopy and Microanalysis meetings, has organized a bi-annual Surface Analysis symposium since 2006 and is a 2017 MAS tour speaker.
Carnegie Institution of Washington
Emma Bullock is a Microbeam Specialist at the Geophysical Laboratory, Carnegie Institution for Science in Washington, D.C. Emma’s current role is to operate and maintain Carnegie’s new JEOL 8530F electron probe, which is equipped with 5 WDS spectrometers, 2 EDS detectors, and the xCLent hyperspectral system. Emma specializes in quantitative analysis, high-resolution imaging, and CL imaging. She has been involved in a diverse range of high-profile research projects at Carnegie, including thermobarometry of terrestrial granites, analysis of meteoritic samples, analysis of super-deep diamonds and their inclusions, the quest for samples that reflect life’s origins, and material science projects designed to search for new semiconductors. Before moving to Carnegie, Emma worked as a geologist at the Smithsonian Institution’s National Museum of Natural History, where she studied primitive meteorites, specializing in the earliest solids that formed in our solar system. Emma has been involved in the Lehigh Microscopy School since 2016.
6705 Vallecitos Road
Sunol, CA 94586
Roseann directs the application of quantitative analytical techniques to characterize materials of scientific and technological interest for Belcan Vallecitos Laboratories. She has contributed to studies in diverse fields from structural biology as supervisor of the TEM Facility for Ken Downing at Lawrence Berkeley National Laboratory to a variety of materials research efforts as the HREM instrument scientist at Argonne National Laboratory. Roseann has been a member of MAS since 1987.
Anette von der Handt
Earth Sciences, University of Minnesota
John T. Tate Hall
116 Church Street SE
Minneapolis, MN 55455
Phone: (612) 624-7370
Anette von der Handt runs the Electron Microprobe Laboratory at the University of Minnesota in Minneapolis where she just acquired a new JEOL JXA8530FPlus with an SXES detector. She received her Ph.D. in Geochemistry from the Max-Planck Institute for Chemistry, Germany, in 2008, studying rocks from the Arctic ocean by EPMA and SIMS. This was followed by a Post-doc at the University of Hawaii and an assistant professor position at the University of Freiburg. Anette has worked on many aspects of micro-analytical methods with a recent focus on trace element and ultra-light element (C, O, N) analysis as well as developing strategies for the analysis of beam-sensitive materials.
Anette has been a MAS member since 2012, is a co-initiator and leader-elect of the joint MAS-MSA FIG MicroAnalytical Standards (figmas.org), co-organized various micro-analytically focused sessions at AGU 2014, M&M 2017 and 2018 as well as the MAS topical conferences ‘EPMA 2016’ and the upcoming ‘QMA 2019’. She is also the administrator of the JEOL probeusers listserv, moderator and contributor at various micro-analytically focused online forums and trains other EPMA users and lab managers in the use of Probe-for-EPMA and micro-analytical methods.
National Institute of Standards and Technology
100 Bureau Drive, Stop 8371
Gaithersburg, MD 20899-8371
Tel: +1 301 975 2860
Fax: +1 301 417 1321
Andrew Herzing received his M.Sc. and Ph.D. in materials science and engineering from Lehigh University under the supervision of Professor Christopher Kiely. During this period he was awarded the George P. Conard award for Outstanding Graduate Student. He then spent two years as a National Research Council postdoctoral fellow at the National Institute of Standards and Technology in Gaithersburg, MD, where he is now a staff scientist in the Material Measurement Laboratory. Andrew’s research is centered on the quantitative structural and chemical characterization of small volumes of material using electron microscopy techniques. In particular, he is currently focused on the characterization of organic composites, developing quantitative methods for three-dimensional characterization of materials using tomographic techniques, and the measurement of surface plasmon resonance behavior in individual nanostructures. He has contributed to over 70 peer-reviewed publications and three book chapters in a wide variety of fields involving electron microscopy. In 2017, Andrew was presented with the K. F. J. Heinrich award from the Microanalysis Society.
Commercial Director (2018-2020)
Director of Engineering
91 McKee Drive
Mahwah, NJ, 07430 USA
Patrick received a BS in 1981 (University of Pittsburgh) and a Ph.D. in 1986 (University of Pittsburgh), all in Materials Science and Engineering. He joined Oak Ridge National Laboratory (Oak Ridge, TN) as a post-doctoral scholar from 1986-1988. He worked at NBS/NIST (Gaithersburg, MD) from 1988-1990, moved to University of Wisconsin-Madison as Research Faculty with Thomas Kelly from 1990-1997. He worked for NORAN Instruments, now Thermo Fisher Scientific, as Applications Scientist from 1997-2013 in Madison, WI. He moved to EDAX (Mahwah, NJ) in 2013, now working as the Director of Engineering. He received the Erwin Mueller Young Scientist Award in 1988 from IFES. He has helped organize 3 IFES meetings and was the Sponsorship Director of IUMAS-6. Patrick had vast experience in applying APFIM to materials characterization of phase transformations on the nanometer scale. He then moved into EDS, WDS, and EBSD to assist customers with microanalysis characterization on a wide variety of inorganic materials. He now directs all of the microanalysis product development at EDAX.