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QMA-2019

QMA-2019 is history but you can still download the program.

Hi-res (62MB)   Low-res (12MB)

(For best results, right click and download the program guide to your computer )

News and Announcements

One more day to get the Early Bird registration rate for M&M 2021!

Don’t miss out on the discounted registration fee for M&M2021! The Early Bird registration rate deadline was extended to June 15, 2021. Register by this Tuesday and save money at all registration levels. Register here for M&M 2021!

Congratulations to the 2021 Major Award Winners!

The Major Awards of the Society honor distinguished scientific contributions to the field of microscopy and microanalysis by technologists and by scientists at various career stages, as well as distinguished service to the Society. The honor will be conferred at the upcoming Microscopy & Microanalysis 2021 (M&M 2021) meeting.   Please congratulate this year’s awards […]

ZEISS SCOPEs Grant: Apply to win a free microscope for your K-12 classroom

During these challenging times, science teachers are seeking ways to develop cutting-edge, engaging remote-learning lessons and curriculum. ZEISS has launched a granting program to give away microscopes throughout the school year of 2021 to K-12 schools in districts that are interested in incorporating digital microscopy into their lesson plans in the coming year.

2020 MAS Fellows and Awardees

Events

  • Southeastern Microscopy Society (SEMS) Annual Meeting

    June 24, 2021


    The 56th annual meeting for the Southeastern Microscopy Society' (SEMS) will be held virtually on June 24, 2021! Please visit the SEMS website (http://southeasternmicroscopy.org/meetings/) for meeting Flyer, Agenda and the "Call for Papers" information for the Ruska Student and the Robert Simmons Micrograph Competitions.


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  • X-12 Short Course: Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation

    August 1, 2021  8:30 am - 5:30 pm

    Sunday Short Course at M&M2021 (Virtual)

    LEAD INSTRUCTORS:
    David Muller, Cornell University
    Colin Ophus, Lawrence Berkeley National Laboratory

    With modern electron detector technology, it is now possible to record full images of a converged STEM probe while scanning it over the sample surface, resulting in a 4D-STEM dataset. Because the atomic-scale scattering information contained in an atomic-scale STEM probe is decoupled from the step size between STEM probe positions, 4D-STEM can be used for experiments ranging from sub-Angstrom resolution phase contrast imaging to statistical characterization of functional materials over large length scales. In this course, we will give tutorials on how to perform 4D-STEM experiments, analyze the (potentially very large!) resulting datasets, and perform 4D-STEM simulations.


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Times are all local to the event.

See the full list of events