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QMA-2019

QMA-2019 is history but you can still download the program.

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(For best results, right click and download the program guide to your computer )

News and Announcements

Upcoming: ASTM E42 Surface Analysis Community Forum on 11/06/2020

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ASTM committee E42 on surface analysis invites you to attend our community forum discussion on issues affecting credibility in XPS analysis and interpretation. Join us for a virtual discussion of this surface analysis research community topic and help determine the best solution path that addresses these pressing issues. 

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MAS webinar: “TKD 101: An Introduction to Transmission Kikuchi Diffraction”

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Please join us for another MAS webinar on November 20 2020 at 1 p.m. (EDT)! Chad Parish, Oak Ridge National Laboratory will talk about the basics of Transmission Kikuchi Diffraction, analytical strategies and error sources and show a few examples of practical materials problem solving using TKD. The live webinar will consist of a 50-minute presentation, followed by a Q&A.

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2020 MAS Fellows and Awardees

Events

  • Southeastern Microscopy Society (SEMS) Annual Meeting

    June 24, 2021


    The 56th annual meeting for the Southeastern Microscopy Society' (SEMS) will be held virtually on June 24, 2021! Please visit the SEMS website (http://southeasternmicroscopy.org/meetings/) for meeting Flyer, Agenda and the "Call for Papers" information for the Ruska Student and the Robert Simmons Micrograph Competitions.


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  • X-12 Short Course: Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation

    August 1, 2021  8:30 am - 5:30 pm

    Sunday Short Course at M&M2021 (Virtual)

    LEAD INSTRUCTORS:
    David Muller, Cornell University
    Colin Ophus, Lawrence Berkeley National Laboratory

    With modern electron detector technology, it is now possible to record full images of a converged STEM probe while scanning it over the sample surface, resulting in a 4D-STEM dataset. Because the atomic-scale scattering information contained in an atomic-scale STEM probe is decoupled from the step size between STEM probe positions, 4D-STEM can be used for experiments ranging from sub-Angstrom resolution phase contrast imaging to statistical characterization of functional materials over large length scales. In this course, we will give tutorials on how to perform 4D-STEM experiments, analyze the (potentially very large!) resulting datasets, and perform 4D-STEM simulations.


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Times are all local to the event.

See the full list of events