ASTM committee E42 on surface analysis invites you to attend our community forum discussion on issues affecting credibility in XPS analysis and interpretation. Join us for a virtual discussion of this surface analysis research community topic and help determine the best solution path that addresses these pressing issues.
Please join us for another MAS webinar on November 20 2020 at 1 p.m. (EDT)! Chad Parish, Oak Ridge National Laboratory will talk about the basics of Transmission Kikuchi Diffraction, analytical strategies and error sources and show a few examples of practical materials problem solving using TKD. The live webinar will consist of a 50-minute presentation, followed by a Q&A.
Southeastern Microscopy Society (SEMS) Annual Meeting
June 24, 2021
The 56th annual meeting for the Southeastern Microscopy Society' (SEMS) will be held virtually on June 24, 2021! Please visit the SEMS website (http://southeasternmicroscopy.org/meetings/) for meeting Flyer, Agenda and the "Call for Papers" information for the Ruska Student and the Robert Simmons Micrograph Competitions.
X-12 Short Course: Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation
August 1, 20218:30 am - 5:30 pm
Sunday Short Course at M&M2021 (Virtual)
LEAD INSTRUCTORS: David Muller, Cornell University Colin Ophus, Lawrence Berkeley National Laboratory
With modern electron detector technology, it is now possible to record full images of a converged STEM probe while scanning it over the sample surface, resulting in a 4D-STEM dataset. Because the atomic-scale scattering information contained in an atomic-scale STEM probe is decoupled from the step size between STEM probe positions, 4D-STEM can be used for experiments ranging from sub-Angstrom resolution phase contrast imaging to statistical characterization of functional materials over large length scales. In this course, we will give tutorials on how to perform 4D-STEM experiments, analyze the (potentially very large!) resulting datasets, and perform 4D-STEM simulations.
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