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M&M2023 Abstracts are Available Now!
/in Meetings /by webbymasThe M&M2023 abstracts are out now in Volume 29, Issue Supplement_1 of the Microscopy and Microanalysis Journal
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View the M&M 2023 Meeting Platform and Full Schedule!
/in News Item /by webbymasThe M&M 2023 event website and conference app are ready for you to access!
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Connect with MAS at M&M2023
/in M&M Meeting, News Item /by webbymasMicroscopy & Microanalysis 2023 is right around the corner, and we are all looking forward to a great meeting! Find out how to connect with MAS during the meeting.
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In Memory of James Bentley, MAS Fellow and Electron Microscopy Legend
/in News Item /by webbymasIt is with great sadness that we share the news of the passing of James (Jim) Bentley, dear friend and colleague.
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In Memory of Lena Kourkoutis, Renowned Electron Microscopist and Mentor
/in News Item /by webbymasMAS is deeply saddened to hear of the passing of our colleague and friend, Lena Kourkoutis.
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Congratulations to the 2023 Best Paper Award Winners!
/in News Item /by webbymasThe Microanalysis Society is proud to announce this year’s Best Paper Award Winners.
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In Memory of Phillip E. Russel, MAS Fellow and AFM Legend
/in News Item /by webbymasIt is with profound sadness that MAS has learned of the death of Phillip E. Russel, MAS Fellow.
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2023 IUMAS Scientific Program Is up and You Can Still Register
/in Meetings /by webbymasThe joint IUMAS 8 & FIB SEM / MSC-SMC Annual Meeting will take place from June 11-16 in Banff, Canada. The scientific program is now available and there are still a few registration spots available!
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Lehigh Microscopy School – 50th Anniversary Edition
/in News Item /by Nicholas RitchieIn the world of big-time, small-scale characterization, the Lehigh Microscopy School (LMS) has been leading the way for 50 years, and shows no signs of slowing down.
The school’s 2023 offering, June 4 – June 9, will mark a half century since the annual week-long program was founded to help keep colleagues and professionals in the research community abreast of developments in scanning electron microscopy. The first Lehigh Microscopy School was organized by renowned Lehigh University Professor Joe Goldstein in the summer of 1970 with three lecturers, a dozen students, and a single scanning electron microscope (SEM). Since then, the annual Lehigh-hosted event has grown to become the largest school of its kind. Now in its 50th year, the weeklong school offers basic and advanced courses that combine theory with lab practice. Manufacturers’ microscopes supplement the nine scanning and transmission electron microscopes in Lehigh’s Materials Characterization Facility, one of the best equipped of its kind in the United States.
According to Chris Kiely, a professor of materials science and engineering in the P.C. Rossin College of Engineering and Applied Science who serves as the school’s director, it is the faculty, staff, and invited lecturers who bring the program to life each year and continue to uphold its long-standing reputation for quality among the representatives of industry, national labs, and academia in attendance. “There are folks who attend who have never seen these instruments before, and quite a few who have worked with them and are looking to gain more experience,” says Kiely. “We teach them about the scanning electron microscope, how it’s built, what it can do, and how it operates. We’ll also show them how versatile it is, and the various ways for setting it up to do different tasks.”
The Lehigh Microscopy School is open to interested engineers, scientists, and technicians. Course offerings include Scanning Electron Microscopy, Transmission Electron Microscopy, X-ray Microanalysis, Focused Ion Beam (FIB) Instrumentation and Applications, and Quantitative X-ray Microanalysis using EDS and WDS techniques. For more information or to register, visit lehigh.edu/microscopy.
M&M 2023 – Paper Submission Deadline extended
/in News Item /by webbymasM&M 2023 Call for Submissions deadline has been extended to Tuesday, February 21, 2023! Read more
Historical Microanalysis Meeting Proceedings
/in News Item /by webbymasHave you been searching for a specific decades-old abstract? Are you curious who presented at the first National Conference on Electron Probe Microanalysis? Read more
CMMS: Celebrating Dale Newbury’s 50 years at NIST
/in News Item /by Nicholas RitchieThe Chesapeake Microscopy and Microanalysis Society (AReS) is holding a day-long meeting to celebrate Dale Newbury’s 50th anniversary at the National Institute of Standards and Technology. The event will be held on 16-Feb-2023 at the Institute for Bioscience and Biotechnology Research, 9600 Gudelsky Dr, Rockville, MD 20850. Speakers will include Joseph Michael (previously from Sandia National Laboratory), Masashi Watanabe (Lehigh University), Richard Leapman (NIH) and a colorful collection of collaborators and co-conspirators from Dale’s career.
Advanced Registration Required!
Sponsored by Bruker, JEOL, and Rave Scientific.
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Consider submitting an abstract to IUMAS8!
/in News Item /by webbymasAbstracts are due January 13, 2023. Don’t miss out on the 8th Meeting of the International Union of the Microbeam Analysis Society in beautiful Banff, Canada.
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Registration for IUMAS 8 is open!
/in News Item /by webbymasDon’t miss out on the 8th Meeting of the International Union of the Microbeam Analysis Society! Registration is open now. There is very limited space and early bird prices end Dec 31.
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There Is Still Time: Apply for the Goldstein Scholar Award!
/in News Item /by webbymasMAS, the Meteoritical Society and Springer are excited to remind you that applications are open for the Joseph Goldstein Scholarship. This award provides travel to a class or an opportunity to work at a different institution that would help with their research. More information can be found here: https://the-mas.org/awards/goldstein_scholar/. The deadline for the fall round is November 1, 2022. Read more