Please Welcome our New MAS Directors and MAS Secretary

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The election results are in! MAS is pleased to welcome to the Executive Council, Directors Assel Aitkaliyeva (University of Florida) and Thomas Lam (Smithsonian Institution), and Secretary Owen Neill (University of Michigan)!

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We Have a New Goldstein Scholar!

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MAS is pleased to announce that the Goldstein Scholar has been awarded to Dara Laczniak from Purdue University. Her project is titled ” Understanding Space Weathering of Carbon-Rich Asteroids Through In-Situ Transmission Electron Microscopy”.

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M&M 2023 Call for Symposium Ideas

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The M&M 2023 Executive Program Committee wants to hear from you! Symposium topics are being solicited in the areas of biological sciences, physical sciences and analytical sciences/instrumentation advances.

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Don’t forget to vote in the MAS Election!

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MAS Election season is here! The election will run until December 1st. Two people are running for the position of MAS Director, and one person for the position of MAS Secretary.

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In Memory of our Microanalysis Colleague Daniel Kent Ross

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We are saddened to hear of the passing of our colleague Daniel Kent Ross.

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MAS Events at M&M2021

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Cast your vote for the Microscopy Today 2021 Micrograph Awards!

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Voting is now open for the Microscopy Today 2021 Micrograph Awards! Cast your vote for the People’s Choice Award.

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One more day to get the Early Bird registration rate for M&M 2021!

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Don’t miss out on the discounted registration fee for M&M2021!

The Early Bird registration rate deadline was extended to June 15, 2021. Register by this Tuesday and save money at all registration levels.

Register here for M&M 2021!

Congratulations to the 2021 Major Award Winners!

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The Major Awards of the Society honor distinguished scientific contributions to the field of microscopy and microanalysis by technologists and by scientists at various career stages, as well as distinguished service to the Society. The honor will be conferred at the upcoming Microscopy & Microanalysis 2021 (M&M 2021) meeting.

 

Please congratulate this year’s awards winners!

 

PRESIDENTIAL SCIENCE AWARD
Hideyuki Takahashi
JEOL Ltd

PRESIDENTIAL SERVICE AWARD
John Fournelle
University of Wisconsin, Madison

PETER DUNCUMB AWARD FOR EXCELLENCE IN MICROANALYSIS
Yimei Zhu
Brookhaven National Laboratory

KURT F.J. HEINRICH AWARD
Katherine Burgess
U.S. Naval Research Laboratory

ZEISS SCOPEs Grant: Apply to win a free microscope for your K-12 classroom

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Carl Zeiss Microscopy, LLC, a MAS Sustaining Member, is pleased to announce the Science Classroom Outreach Program for Educators (SCOPEs) Grant. Each month, they will award one winner with a ZEISS classroom microscope package including an optical microscope, digital camera, and software.
Combined with video chat software or in-person smartboard/projector, students can live tour microscopic specimens, teachers can collect UHD 4K images for lecture notes and homework assignments, and science programs as a whole can be taken to the next level.
Who can apply for this grant:
  • K–12 science educators who are looking for a way to virtually share microscopy lessons.
  • Schools located in the United States.

Anyone interested can find out more information and apply here: ZEISS SCOPEs Grant

Virtual EPMA Workshop from Athens

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Athens WorkshopThe Agricultural University of Athens has announced that it will be holding a five-day workshop from 5-9 April 2021 on the use of the electron probe microanalyzer (EPMA). There will be a particular emphasis on modern developments and geological applications.  The workshop is designed to educate undergraduates, graduates, and early career researchers in the theory and practice of EPMA.   The program consists of a set of online lectures covering topics ranging from conventional major element quantitative analysis to new developments in X-ray mapping, trace element analysis, measuring oxidation state and water content of hydrous glasses, and characterizing meteorites. A poster presentation from participants on the first day using Gather.Town will help participants get to know each other and highlight topics of interest for the rest of the course. Additionally, participants will have the option to acquire one to two days of hands-on data on the EPMA housed at our lab (Laboratory of Mineralogy and Geology; Agricultural University of Athens).

Interested individuals should consult the meeting website.

The votes are in: 2021 MAS Leadership Election Results

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Thanks to everyone who voted in the 2021 MAS Leadership Election!
Joining MAS Council in the new year are:
President-Elect: Pat Camus
Treasurer – Dave Tomlin
Director – Angela Halfpenny
Director – Josh Taillon
Commercial Director: Steve Seddio
Happy Holidays from MAS! Wishing you a new year of health and happiness.
Heather Lowers, MAS President

The M&M 2021 Submission Site is now open!

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Get ready for M&M 2021! Mark your calendar and Save the Date for the premier microscopy education and networking event of the year — Microscopy & Microanalysis 2021, August 1-5, in Pittsburgh, Pennsylvania!

 

Go to the M&M 2021 website and click on the Submit Your Paper button, or go directly to the submission site:
The submission deadline is Thursday, February 18, 2021 at 11:59 PM, U.S. Eastern Time.

 

This year, presenters will have to option to indicate their presentation preference (Virtual or In-Person) during the submission process. Even if you know you cannot attend the in-person meeting, please still submit your paper! The submission site will not open again after the deadline.
Look for the M&M 2021 Call for Papers Brochure with the November/December issue of Microscopy Today. For more information on M&M 2021, visit the website at https://www.microscopy.org/MandM/2021/.

Upcoming: ASTM E42 Surface Analysis Community Forum on 11/06/2020

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ASTM committee E42 on surface analysis invites you to attend our community forum discussion on issues affecting credibility in XPS analysis and interpretation.  

 

ASTM E42 Surface Analysis Community Forum

Friday, November 6, 2020,

12:00 EST (18:00 Europe, 17:00 UK, 09:00 Pacific US)

Duration: 90 minutes

 ASTM WebEx Meeting Registration Link

https://astm.webex.com/astm/j.php?RGID=r9eef58a8e94646b8d9cb098bb0a671f5

Registration required to receive meeting login.

 

Data in the literature that is poorly acquired, analyzed, or presented can have far reaching effects on the credibility of any technique.  Ensuring that the community has the resources available to help the expanding user base will benefit us all

Join us for a virtual discussion of this surface analysis research community topic and help determine the best solution path that addresses these pressing issues.

Leading experts will lead discussion with participants, laying out the specifics of the problem, explaining how this has progressed and the resources currently available, and then looking forward to how we can improve the resources available and their distribution, with a goal of providing tools to improve research results.

 

The Problem, as it affects the research community

Matt Linford will describe a multi-institutional and multi-country analysis of XPS reported in three scientific journals which demonstrates significant problems in the analysis of XPS data appearing in the literature. He will describe a quantitative assessment of the problems and report information learned about the most common issues that have been observed.

 

The Structure of the current toolkit

Mark Engelhard will then provide a short summary of early issues in XPS analysis which motivated the creation of the standards committees ASTM E42 and ISO TC201, and will summarize the types of standards and guides that have been created, and explain some of the inter-relationships among relevant surface analysis standards in E42 and TC201.   Recent investigations questioning the adequacy of the reporting of analysis information specified in ISO and ASTM standards will be discussed, as an example of the limitations of the standards and guides in meeting the community data reporting challenges.

 

The Strategy Going Forward

Don Baer will relay the development of recent guides that are intended to help address the issues and explain what is still in the pipeline.  He will explore other tools that might be useful, including the possibility of an XPS reporting guide that could indicate prescribed reporting for levels of confidence and the work towards normalization of these.  One objective of this presentation is to seek community input on tools and/or other approaches on how to decrease the incorrect XPS data reports in the literature.  Such discussion can guide development of ASTM 42, ISO TC201, AVS Recommended Practices and other activities.

Together, we can build a framework to ensure that resource is available for the research community to help improve the quality of surface analysis result reporting!

MAS webinar: “TKD 101: An Introduction to Transmission Kikuchi Diffraction”

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Please join us for another MAS webinar! Chad Parish, Research and Development Staff Member in the Radiation Effects and Microstructural Analysis Group, Oak Ridge National Laboratory and long-time MAS member will talk about about the basics of Transmission Kikuchi Diffraction, analytical strategies and error sources and show a few examples of practical materials problem solving using TKD.

The live webinar will consist of a 50-minute presentation, followed by a Q&A. The webinar is free but requires a registration.

When: November 20, 2020 at 1 p.m. EDT.

Registration: https://umn.zoom.us/webinar/register/WN__vfPG3FBQAOzcYuIVfso2g

Webinar description: Over the last two to three decades, electron backscatter diffraction (EBSD) emerged as one of the most powerful and exciting methods in electron microscopy to quantify the crystallographic microstructures of materials. Over the last decade or so, transmission Kikuchi diffraction (TKD) has emerged as a vital and important complement to EBSD.

In TKD, a thin specimen (as might be used for transmission electron microscopy) is mounted into the scanning electron microscope (SEM) and held very near (<10 mm) the objective lens. Electron Kikuchi diffraction patterns are then acquired using the EBSD hardware, but in transmission mode and from the electron exit surface of the foil, as opposed to reflection mode from the entrance surface as in EBSD. This provides improved spatial resolution, often 10 nm or finer, compared to several hundred nm or coarser in conventional EBSD. This opens unprecedented capabilities for materials analysis.

This seminar will (1) briefly discuss the basics of TKD and put them into their historical perspective compared to EBSD; (2) discuss how to acquire TKD data, with emphasis on artifacts, errors, and things to watch out for; and (3) show a few examples of practical materials problem solving using TKD.

This work is supported by US Department of Energy, Office of Science, Fusion Energy Sciences, under contract number DE-AC05-00OR22725.

Keywords: SEM, TKD, EBSD

Webinar Speaker: Dr. Chad Parish is a Research and Development Staff Member in the Radiation Effects and Microstructural Analysis Group, Materials Science and Technology Division, Oak Ridge National Laboratory. His research involves electron microscopy to solve problems in materials for nuclear energy systems. Chad has been an MAS member since 2004 and the Secretary of MAS since 2018.