Resources

Historical Meeting Proceedings

• Annual Meeting Proceedings 1966 to 1993

Videos

• History of Microscopy – Joel Sheffield, Ph.D. Emeritus Professor of Biology Temple University, Philadelphia, PA
• Using DTSA-II Tutorials – Nicholas W. M. Ritchie, Ph.D. National Institute of Standards and Technology, Gaithersburg, MD

Standards

ASTM

• E766-14^e1: Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• E1588-17: Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
• E1508-12a: Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
• E986-04(2017): Standard Practice for Scanning Electron Microscope Beam Size Characterization
• E2142-08(2015): Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
• ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
• ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
• ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
• ASTM E2627-13 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
• ASTM E3-11(2017) Standard Guide for Preparation of Metallographic Specimens

ISO Standards

• ISO 16700:2016 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
• ISO 22309:2011 Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
• ISO 22489:2016 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
• ISO 22493:2014 Microbeam analysis — Scanning electron microscopy — Vocabulary
• ISO 22029:2012 Microbeam analysis — EMSA/MAS standard file format for spectral-data exchange
• ISO/TS 24597:2011 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
• ISO 9220:1988 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
• ISO/TS 10798:2011 Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
• ISO 14966:2002 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
• ISO 16000-27:2014 Indoor air — Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
• ISO 17751-2:2016 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends — Part 2: Scanning electron microscopy method
• ISO/CD 21915-1 Textiles – Qualitative and quantitative analysis of some cellulose fibres (lyocell, cupro) and their blends — Part 1: Fibre identification using scanning electron microscopy and spectral analysis methods

Other

• MSA / MAS / AMAS HyperDimensional Data File
• Original 1991 version of the MSA/MAS Spectral File format – became ISO 22029
• NBS SRM-2063 Thin Film Standard for Microanalysis Certificate
• NIST SRM-2063a Thin Film Standard for Microanalysis Certificate – reissue

Software

• Win X-Ray – A Monte Carlo Simulation Program
  • This program is a Monte Carlo simulation of electron trajectory in solid. This new Monte Carlo programs, Ray, is a extension of the well known Monte Carlo program CASINO, which includes statistical distributions for the backscattered electrons, trapped electrons, energy loss and phi rho z curves for X-ray. The new added features in Ray are: the complete simulation of the X-ray spectrum, the charging effect for insulating specimen.
• Casino – A Monte Carlo Simulation Program
  • This program is a Monte Carlo simulation of electron trajectory in solid specially designed for low beam interaction in a bulk and thin foil. This complex single scattering Monte Carlo program is specifically designed for low energy beam interaction and can be used to generate many of the recorded signals (X-rays and backscattered electrons) in a scanning electron microscope. This program can also be efficiently used for all of the accelerated voltage found on a field emission scanning electron microscope(0.1 to 30 KeV).
• NIST DTSA-II – EDS Quantification and Simulation
  • NIST DTSA-II is “power tools for x-ray microanalysis.” It integrates electron excited x-ray spectrum analysis tools with simulation tools in a manner that allows you to “simulate what you measure and measure what you simulate.”  It provides standards-based quantitative analysis algorithms for bulk materials and Monte Carlo and analytical simulation algorithms.
• GMRFilm – Thin film quantification software
  • Fortran version – John Minter’s port
  • Original Code – Waldo
  • DOS version – Won’t run of x64 systems
• Open Microanalysis – A collection of open source microanalysis tools
  • CalcZAF – John Armstrong’s ZAF calculation tools
  • CalcZAF on the Probe Software site
• NIST FFAST Mass Absorption Coefficient database
  • NIST SRD-66: X-Ray Form Factor, Attenuation, and Scattering Tables
• David Joy’s Smart SEM resolution macro
• Nestor Zaluzec’s Microscopy and Microanalysis Toolkit

Community Member’s Sites

• Anette von der Handt’s Useful Links for Microanalysis
• John Fournelle’s Geoscience 777 course site
• Probe Software’s User Forum
• David Joy’s Metrology and Lithography group page