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QMA-2019

QMA-2019 is history but you can still download the program.

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News and Announcements

Virtual EPMA Workshop from Athens

The Agricultural University of Athens has announced that it will be holding a five-day workshop from 5-9 April 2021 on the use of the electron probe microanalyzer (EPMA). There will be a particular emphasis on modern developments and geological applications.  The workshop is designed to educate undergraduates, graduates, and early career researchers in the theory […]

The votes are in: 2021 MAS Leadership Election Results

Thanks to everyone who voted in the 2021 MAS Leadership Election! Find out who will be joining the MAS Council in the new year.

The M&M 2021 Submission Site is now open!

Get ready for M&M 2021! Mark your calendar and Save the Date for the premier microscopy education and networking event of the year — Microscopy & Microanalysis 2021, August 1-5, in Pittsburgh, Pennsylvania! The paper submission site just opened and the submission deadline is Thursday, February 18, 2021 at 11:59 PM, U.S. Eastern Time.

2020 MAS Fellows and Awardees

Events

  • Southeastern Microscopy Society (SEMS) Annual Meeting

    June 24, 2021


    The 56th annual meeting for the Southeastern Microscopy Society' (SEMS) will be held virtually on June 24, 2021! Please visit the SEMS website (http://southeasternmicroscopy.org/meetings/) for meeting Flyer, Agenda and the "Call for Papers" information for the Ruska Student and the Robert Simmons Micrograph Competitions.


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  • X-12 Short Course: Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation

    August 1, 2021  8:30 am - 5:30 pm

    Sunday Short Course at M&M2021 (Virtual)

    LEAD INSTRUCTORS:
    David Muller, Cornell University
    Colin Ophus, Lawrence Berkeley National Laboratory

    With modern electron detector technology, it is now possible to record full images of a converged STEM probe while scanning it over the sample surface, resulting in a 4D-STEM dataset. Because the atomic-scale scattering information contained in an atomic-scale STEM probe is decoupled from the step size between STEM probe positions, 4D-STEM can be used for experiments ranging from sub-Angstrom resolution phase contrast imaging to statistical characterization of functional materials over large length scales. In this course, we will give tutorials on how to perform 4D-STEM experiments, analyze the (potentially very large!) resulting datasets, and perform 4D-STEM simulations.


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Times are all local to the event.

See the full list of events