Visit the M&M 2025 website for a full list of symposia, pre-meeting congresses, short courses, and more!

Additional materials to help with your submission:

• Manuscript Preparation & Information
• M&M 2025 Paper Example
• License to Publish Requirements

All submitters must read and acknowledge the License to Publish requirements form within the Submission task list. No submission (Contribution) will be published unless a License to Publish form has been signed. Learn more about the License to Publish requirements, and expectations and policies for the M&M Proceedings here.

The published paper submission deadline is February 14, 2025, 11:59 PM PT.

In particular, MAS Members may be interested in the following symposia heavily featuring microanalysis:

A04 – Contributions of Analytical Electron Microscopy to Understanding Microstructural Evolution in Materials: James Bentley Memorial Symposium

This memorial symposium will focus on the contributions of analytical electron microscopy and related techniques to advancing our understanding of phase transformations, precipitation reactions, and other reactions in materials that impact properties and performance. Jim Bentley’s career focused on understanding microstructural evolution as it affected material behavior – with important contributions in radiation effects and fundamental phase transformations research. He impacted countless young and not-so-young researchers via his outstanding teaching and collaborative research through the ORNL SHaRE Program. This symposium will honor Jim’s lifetime of contributions to science, education and our technical community by reviewing the status and future prospect of applications AEM with respect to radiation effects and phase transformations and microstructural analysis.

A05 – Latest Advances in Atom Probe Tomography

Atom Probe Tomography (APT) is an evolving analytical technique, producing three-dimensional composition point cloud maps with sub-nanometer spatial resolution and part-per-million chemical sensitivity. The continued evolution of the APT field tracks along two broad fronts: advances in specimen preparation/data analysis and advances in instrumentation. Additionally, correlating with other analytical techniques (e.g., EM, XCT, SIMS) provides broader insights into materials characterization. Under the APFIM-FIG, this symposium serves as a forum for the latest advances in materials applications, APT correlation with other analytical capabilities, as well as theoretical, methodological, and instrument developments.

A08 – Next Generation Microanalysis Standards For EPMA and SEM-EDS Calibration

MAS has sponsored multiyear funding for the development of standard reference materials headed by the FIG Standards group. The proposed MM2025 session will include invited papers reporting on the status of the project and an overview of standard reference materials but also seeks contributed papers in analytical methods for characterization, distribution methods, and use of reference materials in microanalysis. Characterization and calibration methods include EPMA-WDS, SEM-EDS, uXRF, and others.

A09 – Quantitative Electron Diffraction for Materials Analysis, From Transmission Electron Diffraction to EBSD and ECCI

Electron diffraction provides quantitative scattering signals at spatial resolutions from sub-Angstroms to nm for materials structural analysis, including the study of chemical bonds. However, extracting such information using electron diffraction requires advancements in diffraction techniques, theory and analysis algorithms. This symposium will cover electron diffraction techniques in both TEM and SEM, including but not limited to: CBED, microED, precession electron diffraction, electron backscatter diffraction (EBSD), electron channeling contrast imaging (ECCI), transmission Kikuchi diffraction (TKD) and selected area electron channeling patterns (SAECP). Novel techniques, detectors, data interpretation and post-processing (including machine learning and quantitative calibration of material models) are all of interest.

Short Course X10 – EM Data Analysis with the HyperSpy Ecosystem

This short course will cover the basics of data processing and analysis using the open-source HyperSpy ecosystem and show example workflows for electron microscopy datasets. No prior Python knowledge is required.

Pat Camus (MAS President) had the honor of recognizing our 2024 MAS Awardees at the annual M&M Meeting in Cleveland. We are proud to recognize the groups’ accomplishments and their work stands as an inspiration for us all. Congratulations again to all the awardees!

Read more

The Lehigh Microscopy School took a couple years off during the pandemic but since 2023, the 50 plus year annual institution, has been renewed and is teaching the latest in scanning electron microscopy, X-ray microanalysis, focused ion beam microscopy and transmission electron microscopy to a new generation of microscopists.  Read more