Vincent Smentkowski, Senior Scientist, General Electric Global Research
For outstanding leadership and sustained contributions to development of surface science techniques and multivariate statistical analysis methods in microanalysis.
Vin specializes in applications of ToF-SIMS for advanced characterization of surfaces and thin films. He has played a leadership role in the MAS for many years and has twice served as the MAS co-chair of the Microscopy & Microanalysis meeting.
Microscopy Today, Volume 30, Issue 1, 1 January 2022, Pages 15–17, https://doi.org/10.1017/S1551929521001541