Columbus, OH
Each year the MAS supports students to attend the Microscopy and Microanalysis annual meeting
| Name | Affiliation | Paper Title |
| Yung-Chen Wang | University of Washington | Characterization of Protein G B1 Immobilized Gold Nanoparticles using Time of Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy |
| Sebastian Schneider | TU Dresden (Germany) | Quantifying Magnetism on the nm Scale: EMCD on Individual FePt Nanoparticles |
| Chaoyi Teng | McGill University (Canada) | X-ray Microanalysis Phase Map on Rare Earth Minerals with a Conventional and an Annular Silicon Drift Detector |
| Kevin Fisher | University of Michigan | Comparing Plasma-FIB and Ga-FIB Preparation of Atom Probe Tomography Samples |
| Fehmi Yasin | University of Oregon | Development of STEM Holography |
| Eren Suyolcu | MPI Solid State (Germany) | Linking Dopant Distribution and Interatomic Distortions at La1.6M0.4CuO4/La2CuO4 Superconducting Interfaces |
| Jessica Alexander | Ohio State University | Optimized Damage-Reduction 60 keV Monochromated Electron Energy-Loss Spectroscopy Measurements of Optical Properties at the Donor/Acceptor Interface in Organic Photovoltaic Devices |
| Samuel Briggs | University of Wisconsin | Complementary Techniques for Quantification of α´ Phase Precipitation in Neutron-Irradiated Fe-Cr-Al Model Alloys |
| Yu-Tsun Shao | University of Illinois | Fundamental Symmetry of Barium Titanate Single Crystal Determined using Energy-Filtered Scanning Convergent-Beam Electron Diffraction |
| Michael Tanksalvala | University of Colorado, Boulder | Coherent Ptychographic Imaging Microscope with 17.5-nm Spatial Resolution Employing 13.5-nm High Harmonic Light |
| Barnaby Levin | Cornell University | Reverse Engineering Cadmium Yellow Paint from Munch’s “The Scream” with Correlative 3-D Spectroscopic and 4-D Crystallographic STEM |
| Andrew Stevens | Duke University | Compressive STEM-EELS |
| Brian Zutter | University of California, Los Angeles | Temperature Dependence of the Silicon Nitride Volume Plasmon |
| David Baek | Cornell University | Impurity Segregation via Extended Defects in Oxide Thin Films Probed by Aberration-Corrected STEM-EELS |