Our Sustaining Members
Bruker Corporation
Diatome US
Electron Microscopy Sciences
Hitachi High Technologies America, Inc.
ibss Group, Inc.
Lehigh Microscopy School
Micron, Inc.
Oxford Instruments America, Inc.
PNDetector GmbH
Ted Pella, Inc.
TESCAN USA
Thermo Fisher Scientific Inc.
XEI Scientific, Inc.
Probe Software, Inc.
JEOL USA, Inc.
NanoSpective
Gatan Inc.
Carl Zeiss Microscopy, LLC
SEMTech Solutions, Inc.
Applied Physics Technologies
Protochips, Inc.
EBSD 2022 is history but you can still download the program.
(For best results, right click and download the program guide to your computer )
News and Announcements
2022 MAS Fellows and Awardees
Events
Nothing from May 30, 2026 to May 30, 2027.
Times are all local to the event.
The Virtual M&M 2020 Schedule Is Out Now!
The virtual M&M 2020 schedule is out now! https://www.microscopy.org/MandM/2020/MM2020_schedule.pdf (web archive link) Have a look at the meeting website: https://www.microscopy.org/MandM/2020/ (web archive link) To register for the ‘Preparing for M&M’ webinar, presented by the Microscopy Society Student Council on July 16 at 4 p.m. (EDT), go to: https://docs.google.com/forms/d/e/1FAIpQLSeyjz5Ky2EvVvYJYVIDt5mR6kDJjuNXT68Yz3ohAObqcvjrqQ/viewform?usp=sf_link
MAS Webinar: Surface Microscopy and Microanalysis in an Industrial Research and Development Laboratory: General Electric – Research
Please join us for our first MAS webinar on July 15, 2020 at 2 p.m. (EDT)! Vin Smentkowski will cover various techniques for Surface Microscopy and Microanalysis in the Industrial Research and Development Laboratory at GE. The live webinar will consist of a 50 minute presentation, followed by a Q&A.
NIST Workshop (2020-07-13): Current Status and Future Perspective of In-Situ Electron Microscopy for Electronic and Quantum Materials
New developments in electron microscopy (EM) instrumentation now enable the observation and measurement of nanoscale processes in electronic and quantum materials for in situ/operando experiments. These experiments can provide fundamental insight into the structure, chemistry, and functionality of materials in their native or working conditions, measured at high spatial resolution and under various stimuli, such […]