Sustaining Members

Sustaining Members consist of individuals, companies, or corporations wishing to advance the interests and objectives of the society; up to three individuals designated by the sustaining member are deemed regular members of the society.

Applied Physics Technologies Inc.


Applied Physics Technologies Inc.
1600 NE Miller Street
McMinnville, OR 97128

Tel: 503-434-5550
Email: aptsales@a-p-tech.com

www.a-p-tech.com

Thermionic, field emission, and thermal field emission cathodes

Bruker

Bruker Corporation
Contact: Doug Skinner or Ted Juzwak

Bruker Nano Analytics
5465 E Cheryl Pkwy
Madison, WI 53711

Tel: 800-234-XRAY (9729)
Fax: 908-842-0396
Email: info-ewing@bruker.com

www.bruker.com/microanalysis

X-ray microanalysis, EBSD, image analysis

Carl Zeiss Microscopy, LLC
Contact: Karin Solerno

One Zeiss Drive
Thornwood, NY 10594

Tel: +1 800 233 2343
Fax: +1 914 681 7379
Email: info.microscopy.us-at-zeiss.com

www.zeiss.com/microscopy

SEM, TEM, HIM, optical, & correlative microscopy

Diatome US

Diatome US

1560 Industry Road
P.O. Box 410
Hatfield, PA 19440

tel: 215.412.8390
fax: 215.412.8450
email: sgkcck-at-aol.com

Diamond knives

Electron Microscopy Sciences

Electron Microscopy Sciences
Contact: Stacie Kirsch

1560 Industry Road,
PO Box 550
Hatfield, PA 19440

Tel: +1 215 412 8400
Fax: +1 215 412 8450
Email: stacie-at-ems-secure.com

www.emsdiasum.com/

EM and LM supplies

Gatan, Inc
Contact: John Hyun

Corporate Headquarters
5794 West Las Positas Boulevard
Pleasanton, CA 94588

Tel: +1 925 463 0200
Fax: +1 925 463 0204
Email: info-at-gatan.com

www.gatan.com/

EM instruments and software: specimen preparation, holders, imaging, and analysis

Hitachi High Technologies America, Inc.

Hitachi High Technologies America Inc
Contact: Elyn Seaman

1375 North 28th Avenue
Dallas, TX 75261-2208

Tel: +1 512 750 7418
Fax: +1 972 615 9311
Email: chad.ostrander@hitachi-hta.com

https://www.hitachi-hightech.com/us/en/

SEM, TEM, & field-emission SEM and TEM

ibss Group

ibss Group, Inc.
Contact: Vincent Carlino

1559B Sloat Boulevard,
Suite 270
San Francisco, CA 94132-1410
Tel: +1 415 566 5774

Email: vince.carlino-at-ibssgroup.com

www.ibssgroup.com

Field-free ion beam (IBS) deposition systems for EM specimen preparation

JEOL

JEOL USA, Inc
Contact: Macy Corey

11 Dearborn Road
Peabody, MA 01960

Tel: +1 978 535 5900
Fax: +1 978 536 2205
Email: mcorey@jeol.com

www.jeolusa.com/

EPMA, Auger, SEM, TEM, NMR, mass spectrometry

Lehigh Microscopy School

Lehigh University
Contact: Chris Kiely

Department of Materials Science and Engineering
5 East Packer Avenue,
Bethlehem, PA 18015

Tel: +1 610 758 4249
Fax: +1 610 758 4244
Email: chris.kiely-at-lehigh.edu

https://ifmd.lehigh.edu/lehigh-microscopy-school

Education in SEM, AEM, AFM, & microanalysis

Micron, Inc.

Micron, Inc
Contact: James F. Ficca, Jr. or James M. Ficca

3815 Lancaster Pike
Wilmington, DE 19805-1599

Tel: +1 302 998 1836
Fax: +1 302 998 1836
Email: jfficca-at-micronanalytical.com

www.micronanalytical.com/

Analytical Services: SEM, EDS, XRF, XRD, XRR, DSC, TGA, FTIR

NanoSpective
Contact: Brenda Prenitzer

12565 Research Parkway
Suite 390
Orlando, FL 32826

Tel: +1 407-249-1440
Fax: +1 407-249-1440
Email: info@nanospective.com

www.nanospective.com/

FIB,  FE TEM,  STEM,  EELS,  EFTEM,  X-EDS,  FE SEM, SIMS,  LOM,  RBS,  XPS, AES,  XRD, Raman, FTIR, Optical Testing, Surface Metrology

Oxford Instruments America, Inc.

Oxford Instruments
Contact: Ruth Murray

Microanalysis Group
300 Baker Avenue, Suite 150
Concord, MA 01742-2204

Tel: +1 978 369 9933 / +1 800 447 4717
Fax: +1 978 369 8287
Email: nanoanalysi@ma.oxinst.com

www.oxford-instruments.com/

EDS, WDS, & EBSD systems for SEM

PNDetector GmbH

PNDetector
Contact: Johanna Schulz

Postfach 830759
Munich, BY 81707, Germany

Tel: +49 89 309087 100
Email: sales-at-pndetector.de

www.pndetector.de/

Research and development in the field of cutting-edge silicon radiation detectors

Probe Software

Probe Software, Inc
Contact: John Donovan or Barbara Donovan

885 Crest Drive
Eugene, OR 97405

Tel: +1 541 343 3400
Email: donovan-at-probesoftware.com

www.probesoftware.com/

Automation & analysis software for JEOL & Cameca microprobes

Protochips Incorporated

3800 Gateway Centre Blvd #306
Morrisville, NC 27560 USA

Tel: +1 919-377-0800
Email: contact@protochips.com

www.protochips.com

In-situ TEM solutions, TEM data management

SEMTech Solutions
Contact: Gary Brake

3 Executive Park Dr,
North Billerica, MA 01862,

Tel: +1 978-663-9822 x235
Email: gbrake-at-semtechsolutions.com

semtechsolutions.com

Scanning electron microscope services and upgrades, electron beam lithography systems, SEM analytical laboratory services

Ted Pella, Inc.

Ted Pella, Inc
Contact: 
David Rollings

4595 Mountain Lakes Boulevard
Redding, CA 96003

Tel: +1 530 243 2200 / +1 800 237 3526
Fax: +1 530 243 3761
Email: sales-at-tedpella.com

www.tedpella.com/

Microscopy tools and supplies

TESCAN USA

TESCAN-USA, Inc
Contact: Dean Krogman

765 Commonwealth Dr.
Suite 101, Warrendale, PA 15086

Tel: +1 (724) 772-7433
Email: dean.krogman@tescan.com

http://www.tescan.com/

SEM, FIB-SEM, micro-CT, STEM, and Customized Instruments

Thermo Fisher Scientific Inc.

ThermoFisher Scientific
Contact: Dave Rohde

5225 Verona Road,
Bldg 4 Madison, WI 53711

Tel: +1 608 276 6395
Fax: +1 608 273 6865
E-mail: David.Rohde@Thermofisher.com

www.thermoscientific.com/microanalysis

Microanalysis, EBSD & EDXRF systems, & WDS spectrometers

XEI Scientific
Contact: Ronald Vane

XEI Scientific, Inc.
1755 E. Bayshore Rd., Suite 17
Redwood City, CA 94063
USA Email: sales-at-evactron.com
Tel: +1-650-369-0133

Evactron plasma cleaning