Dr. Siebein is a physical  scientist in the Center for Nanoscale Science and Technology (CNST) NanoFab user facility at the National Institute of Standards and Technology (NIST). After receiving her undergraduate and master’s degrees in Mechanical and Materials Engineering from Worcester Polytechnic Institute, she earned her doctoral degree in 2010 in Materials Science and Engineering from the
University of Florida. Subsequently, she was lab manager of the TEM and field-emission SEM laboratories in the Major Analytical Instrumentation Center at the University of Florida for over ten years. In 2012, Dr. Siebein joined the staff of the CNST NanoFab and oversees the industry-leading SEM/ EDS, X-ray diffraction, and atomic force microscopy facilities.

She has extensive experience using TEM, SEM, EDS, and X-ray diffraction to analyze microstructural properties and relationships in a wide range of materials. Dr. Siebein has been an active member of the  MAS for ten years and has spent much of that time as the Chair of both the Affiliated Regional Societies and Sponsored Speaker Committees.