Hideyuki Takahashi received his Bachelor of Engineering degree in analytical chemistry in 1980 from Chiba University. He joined JEOL Ltd. in 1985 and has worked for the electron microscope manufacturer for over 35 years.
Together with Toyohiko Okumura from JEOL, Dr. Takahashi developed novel chemical mapping techniques in the electron probe micro analyzer (EPMA), applied to a variety of mineral and materials applications. While working at JEOL, he earned his Ph.D. in Applied Physics and Engineering in 1997 from Osaka University. More recently, he has been at the forefront of the development of soft X-ray emission spectrometry (SXES) in the EPMA as a comparable alternative to synchrotron-based spectrometers. This effort led to a long collaboration with Professor Masami Terauchi at Tohoku University, developing novel spectrometer designs for TEM and EPMA.
Dr. Takahashi’s position at JEOL has allowed him to collaborate with many other experts over the years, and his analytical expertise extends to a wide range of materials and applications, such as superconductors, battery materials, minerals, device thin films, and biological specimens. He has authored or co-authored over 80 papers and has been invited to speak at meetings and conferences all over the world. From 2005 until 2012, he contributed to the ISO-TC202 committee to create standards for qualitative, quantitative, and mapping for electron microbeam analyses, and he organized and led a dedicated workshop on SXES analysis, the JEOL SXES School, in 2019 and 2021.