Microscopy & Microanalysis 2015, Portland OR

Castaing Award       ♦       Best Student Paper 
Sponsored by

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J. B. Lewis, D. Isheim, C. Floss, T. L. Daulton, D. N. Seidman

Atom-Probe Tomography Measurements of Isotopic Ratios of High-field Materials
with Corrections and Standardization: a Case Study of the 12C/13C of Meteoritic
Nanodiamonds

Birks Award       ♦       Best Contributed Paper 
Sponsored by

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K. W. Zweiacker, M. A. Gordillo, C. Liu, J. T. McKeown, G. H. Campbell, T. LaGrange, B. W. Reed, J. M. Wiezore

Quantitative Phase Analysis of Rapid Solidification Products in Al-Cu Alloys by
Automated Crystal Orientation Mapping in the TEM

Cosslett Award       ♦       Best Invited Paper 
Sponsored by

  
Alexander S Eggeman, Duncan Johnstone, Robert Krakow, Jing Hu, Sergio Lozano-Perez, Chris Grovenor and Paul A. Midgley

Decomposing Electron Diffraction Signals in Multi-Component Microstructures

Macres Award       ♦       Best Instrumentation/Software Paper 

Sponsored by

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A. Valery, E. F. Rauch, A. Pofelski, L. Clément1, F. Lorut

Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction

Awarded at M&M 2016, Columbus, OH