M&M 2015 Best Paper Awards

Castaing Award       ♦       Best Student Paper 
Sponsored by

  
J. B. Lewis, D. Isheim, C. Floss, T. L. Daulton, D. N. Seidman

Atom-Probe Tomography Measurements of Isotopic Ratios of High-field Materials
with Corrections and Standardization: a Case Study of the 12C/13C of Meteoritic
Nanodiamonds

Birks Award       ♦       Best Contributed Paper 
Sponsored by

  
K. W. Zweiacker, M. A. Gordillo, C. Liu, J. T. McKeown, G. H. Campbell, T. LaGrange, B. W. Reed, J. M. Wiezore

Quantitative Phase Analysis of Rapid Solidification Products in Al-Cu Alloys by
Automated Crystal Orientation Mapping in the TEM

Cosslett Award       ♦       Best Invited Paper 
Sponsored by

  
Alexander S Eggeman, Duncan Johnstone, Robert Krakow, Jing Hu, Sergio Lozano-Perez, Chris Grovenor and Paul A. Midgley

Decomposing Electron Diffraction Signals in Multi-Component Microstructures

Macres Award       ♦       Best Instrumentation/Software Paper 

Sponsored by

  
A. Valery, E. F. Rauch, A. Pofelski, L. Clément1, F. Lorut

Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction