Microscopy & Microanalysis 2015, Portland OR
Castaing Award ♦ Best Student Paper
Sponsored by
J. B. Lewis, D. Isheim, C. Floss, T. L. Daulton, D. N. Seidman
Atom-Probe Tomography Measurements of Isotopic Ratios of High-field Materials
with Corrections and Standardization: a Case Study of the 12C/13C of Meteoritic
Nanodiamonds
Birks Award ♦ Best Contributed Paper
Sponsored by
K. W. Zweiacker, M. A. Gordillo, C. Liu, J. T. McKeown, G. H. Campbell, T. LaGrange, B. W. Reed, J. M. Wiezore
Quantitative Phase Analysis of Rapid Solidification Products in Al-Cu Alloys by
Automated Crystal Orientation Mapping in the TEM
Cosslett Award ♦ Best Invited Paper
Sponsored by
Alexander S Eggeman, Duncan Johnstone, Robert Krakow, Jing Hu, Sergio Lozano-Perez, Chris Grovenor and Paul A. Midgley
Decomposing Electron Diffraction Signals in Multi-Component Microstructures
Macres Award ♦ Best Instrumentation/Software Paper
Sponsored by
A. Valery, E. F. Rauch, A. Pofelski, L. Clément1, F. Lorut
Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction
Awarded at M&M 2016, Columbus, OH