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QMA-2019

QMA-2019 is history but you can still download the program.

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News and Announcements

Catch up with FIGMAS

Dear Microanalytical Community, In the summer of 2018, the Focused Interest Group on MicroAnalytical Standards (FIGMAS) will celebrate its 2-year anniversary. Time for us to look back at the past and onto the future! Our primary goals remain unchanged: building a strong community-based database that would list all available information possible on standards and reference materials used […]

MAS Past President’s Message: Sayonara

Dear MAS Members, On August 8, 2018, I passed the MAS presidency to Rhonda Stroud and became one of Past Presidents. I am still in transition process, so that I have not yet felt relief from the heavy pressure being the President. Soon, I will enjoy the relief feeling! The previous President, Tom Kelly has […]

UM hosts the 2018 MAS TC on EBSD

The latest Microanalysis Society Topical Conference on Electron Backscatter Diffraction (EBSD) took place this May 23–25 at the University of Michigan. The organizers, Steve Niezgoda (OSU), Marc DeGraef (CMU), Elena Miranda (CSUN), Andrew Cross (Wash U – St Louis), Bobby Kerns (UM) and Emmanuelle Marquis (UM) ensured a comprehensive program with speakers including Katharina Marquardt […]

2020 MAS Fellows and Awardees

Events

  • Southeastern Microscopy Society (SEMS) Annual Meeting

    June 24, 2021


    The 56th annual meeting for the Southeastern Microscopy Society' (SEMS) will be held virtually on June 24, 2021! Please visit the SEMS website (http://southeasternmicroscopy.org/meetings/) for meeting Flyer, Agenda and the "Call for Papers" information for the Ruska Student and the Robert Simmons Micrograph Competitions.


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  • X-12 Short Course: Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation

    August 1, 2021  8:30 am - 5:30 pm

    Sunday Short Course at M&M2021 (Virtual)

    LEAD INSTRUCTORS:
    David Muller, Cornell University
    Colin Ophus, Lawrence Berkeley National Laboratory

    With modern electron detector technology, it is now possible to record full images of a converged STEM probe while scanning it over the sample surface, resulting in a 4D-STEM dataset. Because the atomic-scale scattering information contained in an atomic-scale STEM probe is decoupled from the step size between STEM probe positions, 4D-STEM can be used for experiments ranging from sub-Angstrom resolution phase contrast imaging to statistical characterization of functional materials over large length scales. In this course, we will give tutorials on how to perform 4D-STEM experiments, analyze the (potentially very large!) resulting datasets, and perform 4D-STEM simulations.


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Times are all local to the event.

See the full list of events