Dear Microanalytical Community, In the summer of 2018, the Focused Interest Group on MicroAnalytical Standards (FIGMAS) will celebrate its 2-year anniversary. Time for us to look back at the past and onto the future! Our primary goals remain unchanged: building a strong community-based database that would list all available information possible on standards and reference materials used […]
Dear MAS Members, On August 8, 2018, I passed the MAS presidency to Rhonda Stroud and became one of Past Presidents. I am still in transition process, so that I have not yet felt relief from the heavy pressure being the President. Soon, I will enjoy the relief feeling! The previous President, Tom Kelly has […]
The latest Microanalysis Society Topical Conference on Electron Backscatter Diffraction (EBSD) took place this May 23–25 at the University of Michigan. The organizers, Steve Niezgoda (OSU), Marc DeGraef (CMU), Elena Miranda (CSUN), Andrew Cross (Wash U – St Louis), Bobby Kerns (UM) and Emmanuelle Marquis (UM) ensured a comprehensive program with speakers including Katharina Marquardt […]
Southeastern Microscopy Society (SEMS) Annual Meeting
June 24, 2021
The 56th annual meeting for the Southeastern Microscopy Society' (SEMS) will be held virtually on June 24, 2021! Please visit the SEMS website (http://southeasternmicroscopy.org/meetings/) for meeting Flyer, Agenda and the "Call for Papers" information for the Ruska Student and the Robert Simmons Micrograph Competitions.
X-12 Short Course: Guidelines for Performing 4D-STEM Characterization from the Atomic to >Micrometer Scales: Experimental Considerations, Data Analysis and Simulation
August 1, 20218:30 am - 5:30 pm
Sunday Short Course at M&M2021 (Virtual)
LEAD INSTRUCTORS: David Muller, Cornell University Colin Ophus, Lawrence Berkeley National Laboratory
With modern electron detector technology, it is now possible to record full images of a converged STEM probe while scanning it over the sample surface, resulting in a 4D-STEM dataset. Because the atomic-scale scattering information contained in an atomic-scale STEM probe is decoupled from the step size between STEM probe positions, 4D-STEM can be used for experiments ranging from sub-Angstrom resolution phase contrast imaging to statistical characterization of functional materials over large length scales. In this course, we will give tutorials on how to perform 4D-STEM experiments, analyze the (potentially very large!) resulting datasets, and perform 4D-STEM simulations.
Click on the different category headings to find out more. You can also change some of your preferences. Note that blocking some types of cookies may impact your experience on our websites and the services we are able to offer.
Essential Website Cookies
These cookies are strictly necessary to provide you with services available through our website and to use some of its features.
We provide you with a list of stored cookies on your computer in our domain so you can check what we stored. Due to security reasons we are not able to show or modify cookies from other domains. You can check these in your browser security settings.
Other external services
We also use different external services like Google Webfonts, Google Maps, and external Video providers. Since these providers may collect personal data like your IP address we allow you to block them here. Please be aware that this might heavily reduce the functionality and appearance of our site. Changes will take effect once you reload the page.