Lehigh Microscopy School 2020
- Introduction to SEM and EDS for the New Operator
- Introduction to TEM
- Scanning Electron Microscopy and X-Ray Microanalysis
- Focused Ion Beam (FIB): Instrumentation and Applications
- Quantitative X-Ray Microanalysis: Problem Solving Using EDS and WDS Techniques
- Transmission Electron Microscopy
Nikki Rump