Leading off the full week courses is the Main SEM & X-ray Microanalysis Course. This course, which focuses on both basic theory and laboratory work, will cover topics in scanning electron microscopy and energy dispersive X-ray spectrometry. Additional, optional classes discuss simulation, sample preparation and wavelength dispersive spectrometry. This class is typically the most popular and is recommended for people who want a firm foundation for an understanding of electron microscopy.
The Focused Ion Beam (FIB): Instrumentation and Applications is an advanced level course. Ion-solid interaction theory will be introduced and used in describing methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics include 2D/3D FIB/SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in instrumentation.
The Transmission Electron Microscopy course is another advanced level course. This course provides an overview of the concepts, instrumentation and application of TEM. It explores topics such as specimen preparation, TEM and STEM imaging modes, electron diffraction, EDS and EELS analysis, and processing of images and spectra.
In addition there is a one day Introduction to SEM and EDS for the New Operator course. This one-day course is designed for students who have not previously had hands-on experience of SEM or EDS analysis. It is a good primer course for those less experienced individuals to “get up to speed” before attending the main SEM Course.
The three full-week courses run from 3 to 7 June 2024 and the one-day course is held on the 2nd of June.
All four are held at Lehigh University in Bethlehem, Pennsylvania.
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