Scott A. Wight

Scott Wight is a Research Chemist in the Microanalysis Research Group of the Surface and Microanalysis Science Division at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland.

He joined the group in 1989 to work on fundamental measurements for x-ray microanalysis with the NIST electron optical bench. He received his BS in Chemistry from the State University of New York at Plattsburgh in 1986. He received his MA from the University of Maryland at College Park in Analytical/Nuclear/Environmental Chemistry in 1989 for his thesis entitled “Development of a System for Tagging Coal Fly Ash Aerosol with Enriched Rare Earth Isotopic Tracer.”

Scott’s research interests include fundamental measurements of electron-induced X-ray specimen interactions, characterization and modeling of the primary electron scattering by gas molecules and its effect on quantitation in the environmental scanning electron microscope, and quantitation by Auger electron spectroscopy. He is active in ISO and ASTM, currently serving as 1st Vice Chair for ASTM Committee E42 on Surface Analysis and as Secretary for the Auger electron spectroscopy subcommittee of the ISO TC 201 committee on surface chemical analysis.

Scott joined the Microbeam Analysis Society (MAS) and the affiliated regional society, the Mid-Atlantic Microbeam Analysis Society, in 1990. He attended his first MAS meeting in San Jose in 1991. Almost immediately thereafter, Scott took over membership services from long-time chair Art Chodos for the next seven years. In 2002, Scott assumed responsibilities for hosting and daily operation of the MAS website. Additionally, he served as chair of the computer activities committee from 2006 to 2009, a period when MAS implemented both online voting and online membership application and renewal. Scott is a wonderful example of a member who has enriched the community through his unselfish service to the society.