Microscopy and Microanalysis 2009 Richmond, VA

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Castaing Award       ♦       Best Student Paper 
Sponsored by

H. L. Xin, D. A. Muller, Cornell University 
Aberration-corrected STEM Imaging and 2-D Elemental-resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer

Birks Award       ♦       Best Contributed Paper 
Sponsored by

M. Takeguchi, A. Hashimoto, K. Mitsuishi, National Institute for Materials Science, Tsukuba, Japan
M. Shimojo, Saitama Institute of Technology, Saitama, Japan 

Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy

Cosslett Award       ♦       Best Invited Paper 
Sponsored by

E. Oltman, R. M. Ulfig, D. J. Larson, Imago Scientific Instruments 
Background Removal Methods Applied to Atom Probe Data

Macres Award       ♦       Best Instrumentation/Software Paper 
Sponsored by

A. Winkelmann, Max-Planck-Institut fuer Mikrostrukturphysik, Germany 
Information Depth and Kikuchi Band Contrast in Electron Backscatter Diffraction Patterns