Microscopy and Microanalysis 2009 Richmond, VA

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Castaing Award       ♦       Best Student Paper 
Sponsored by

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H. L. Xin, D. A. Muller, Cornell University 
Aberration-corrected STEM Imaging and 2-D Elemental-resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer

Birks Award       ♦       Best Contributed Paper 
Sponsored by

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M. Takeguchi, A. Hashimoto, K. Mitsuishi, National Institute for Materials Science, Tsukuba, Japan
M. Shimojo, Saitama Institute of Technology, Saitama, Japan 

Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy

Cosslett Award       ♦       Best Invited Paper 
Sponsored by

 
E. Oltman, R. M. Ulfig, D. J. Larson, Imago Scientific Instruments 
Background Removal Methods Applied to Atom Probe Data

Macres Award       ♦       Best Instrumentation/Software Paper 
Sponsored by

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A. Winkelmann, Max-Planck-Institut fuer Mikrostrukturphysik, Germany 
Information Depth and Kikuchi Band Contrast in Electron Backscatter Diffraction Patterns

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