Andrew Herzing

Andrew Herzing received his Ph.D. in Materials Science and Engineering from Lehigh University in 2007 under the supervision of Professor Christopher Kiely. He was subsequently awarded a National Research Council Postdoctoral Research Associateship to study the nano- and atomic-scale characterization of materials using state-of-the-art transmission electron microscopy (TEM) and microanalysis techniques at NIST.  Currently a staff member in the Surface and Microanalysis Science division of NIST’s Material Measurement Laboratory, Dr. Herzing is developing techniques to enable the robust chemical analysis of engineered nanostructures at ultrahigh spatial resolution as well as to carry out three-dimensional chemical imaging of technologically important structures such as organic photovoltaic devices.