Hendrix Demers is a postdoctoral researcher in the Electrical Engineering Department of Université de Sherbrooke, Canada since 2009. Hendrix received his BSc in Physics and an MSc in Mechanical Engineering, both from the Université de Sherbrooke, as well as a Ph.D. in Mining and Materials Engineering from McGill University, Canada. Before joining Université de Sherbrooke he was a postdoctoral fellow at the College of Nanoscale Science and Engineering a part of the University at Albany, State University of New York.
Hendrix is involved in multiple aspects of microscopy and microanalysis research, including work regarding the X-ray fluorescence quantification algorithm, microanalysis of insulators, and development of the X-ray microcalorimeter detector. He is also author of Win X-Ray, a world-renowned research program that simulates X-ray spectrum collection and has proven to be an invaluable tool for scanning electron microanalysts. This Monte Carlo-based software aids SEM users in better understanding X-ray spectra generated by their materials, but is also used in the field of metrology, as well as in advanced applications such as electron beam lithography.